More titles to consider

Shopping Cart

You're getting the VIP treatment!

With the purchase of Kobo VIP Membership, you're getting 10% off and 2x Kobo Super Points on eligible items.

itemsitem
See your RECOMMENDATIONS

Synopsis

This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration, physical origin of artifacts, and signal/noise limitations. Coverage spans imaging, materials property characterization, in-liquid interfacial analysis, tribology, and electromagnetic interactions.

“Supplementary material for this book can be found by entering ISBN 9780470638828 on booksupport.wiley.com”

You can read this item using any of the following Kobo apps and devices:

  • DESKTOP
  • eREADERS
  • TABLETS
  • IOS
  • ANDROID
  • BLACKBERRY
  • WINDOWS